Search results for: Y.C. Chan
Microelectronic Engineering > 2014 > 122 > Complete > 52-58
Journal of Alloys and Compounds > 2013 > 567 > Complete > 47-53
Materials Science & Engineering A > 2007 > 445-446 > Complete > 686-690
Microelectronic Engineering > 2007 > 84 > 2 > 328-335
Journal of Alloys and Compounds > 2006 > 407 > 1-2 > 208-214
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 3 > 421 - 428
Journal of Alloys and Compounds > 2005 > 393 > 1-2 > 135-140
Journal of Alloys and Compounds > 2005 > 388 > 1 > 75-82
Materials Science & Engineering B > 2004 > 113 > 3 > 184-189