Search results for: H. Pham
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 6 > 1412 - 1422
Applied Nanoscience > 2016 > 6 > 8 > 1167-1173
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 347-403
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 215-253
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 283-312
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 1-47
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 451-512
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 313-346
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 49-95
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 171-213
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 97-130
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 255-282
Springer Series in Reliability Engineering > Software Reliability Assessment with OR Applications > 405-449
Lecture Notes in Computer Science > Advances in Artificial Intelligence > Agents with Genders for Inventory Planning in E-Management > 267-276
Lecture Notes in Computer Science > Fundamental Approaches to Software Engineering > Tools (Demos) and Program Analysis > 440-455
Digital Signal Processing > 2016 > 50 > C > 150-161