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The mathematical models to represent the relationship between the thermal stress and the deterioration rate for electrical insulation are well established based on the Arrhenius law and appropriate underlying probability distributions for constant thermal stress. There are two kinds of methods to deal with the thermal lifetime: one is the two-valued discrete model representing 0 for alive and 1 for...
Assuming that the Arrhenius law holds between the thermal stress and the lifetime, and that the logarithmic lifetime follows some consistent probability distributions at a constant stress. Under such life models, it is crucial to show the optimum test design from an efficiency viewpoint. It would also be useful to know the semi-optimum test plan in which the efficiency is close to that in the optimum...
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