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Typical photoreflectance lineshapes related to simple and complex wafer structures are reviewed and the transient behavior of photoreflectance spectrum components is analyzed in detail. The amplitude and phase delay of different PR spectrum features as function of modulation frequency are derived. A fitting procedure for the photoreflectance spectrum with special consideration of the Seraphin coefficients...
The optical properties of semiconductor pseudomorphic multilayer systems (AlGaAs/GaAs/InGaAs multilayers) are investigated with Jone's matrix method. The theoretical calculation for VCSEL structure agrees with experimental results. In addition, the effect of strain-induced anisotropy of reflectance spectrum (RAS) in a multiplayer structure is analyzed. Furthermore, polarization dependent photoreflectance...
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