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The backscattering yield (BY) is an important factor in elastic peak electron spectroscopy. Monte Carlo (MC) algorithm describing the electron elastic and inelastic backscattering from surfaces is presented applying the continuous slowing down approximation, i.e., an assumption that an electron loses energy continuously along the trajectory length. Energy losses calculations were performed using recently...
An unexpected interface effect for the sampling depth of elastic peak electron spectroscopy (EPES) in applications to the overlayer/substrate system has been found. The sampling depths expressed as an information depth (ID) for Au/Ni and Rh/Al systems and selected energies in the range 200–10,000eV were obtained from Monte Carlo (MC) simulations for typical for EPES cylindrical mirror analyser (CMA)...
While inelastic mean free paths of electrons (IMFPs) for different energies can be calculated for alloys from predictive formulae, IMFPs can be experimentally measured by the elastic peak electron spectroscopy (EPES). In this method, experimentally determined ratios of elastically backscattered electrons from test surfaces and from a reference material are compared with the values evaluated from...
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