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The crystal orientations and structures of poly(ethylene-ran-vinyl acetate) (EVA) ultrathin films (5, 10 nm) spin-coated onto three different substrates (piranha-cleaned, acetone-cleaned, and hexamethyldisilazane-treated Si wafers) were investigated by using atomic force microscopy (AFM) and grazing incidence X-ray diffraction (GIXRD). The crystal orientations were found to be edge-on for all three...
The crystal orientations and structures of poly(ethylene-ran-vinyl acetate) (EVA) films coated onto silicon substrates to a thickness of 5–200 nm were investigated by performing isothermal crystallization of the films. Bulk-like isotropic crystal orientations and orthorhombic crystalline phases were observed in films thicker than 50 nm. In the thinner films (<50 nm), the crystal orientations remained...
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