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Dielectric superlattices of (Ba 0.5 Sr 0.5 )TiO 3 (BST) grown by a metal-organic chemical vapor deposition (MOCVD) have been studied by transmission electron microscopy (TEM). A selected area of electron diffraction patterns clearly show satellite spots that indicate the formation of superlattice of BST film. A superlattice distance is 6.75 9, that is,...
A transmission electron microscopy study on the new hexagonal silicon formed by pulsed laser beam annealing was carried out. It has been demonstrated through the use of a high-resolution transmission electron micrography and selected area electron diffraction patterns that when an amorphous silicon thin film was crystallized by a pulsed laser beam, the resulting polycrystalline matrix contained crystals...
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