Search results for: Y. Ren
Journal of Electronic Testing > 2014 > 30 > 1 > 149-154
Journal of Electronic Testing > 2013 > 29 > 4 > 609-616
Journal of Electronic Testing > 2012 > 28 > 6 > 877-883
Journal of Electronic Testing > 2014 > 30 > 1 > 149-154
Journal of Electronic Testing > 2013 > 29 > 4 > 609-616
Journal of Electronic Testing > 2012 > 28 > 6 > 877-883