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Variations in timing can occur due to multiple sources on a chip. Many circuit level statistical techniques are used to analyze timing in the presence of these sources of variation. It is desirable to have “variation awareness” at the Register Transfer Level (RTL), and estimate block level delay distributions early in the design cycle, to evaluate design choices quickly and minimize...
Executing instructions from the cache has been shown to improve the defect coverage of real chips. However, although the faults detected by such tests can be determined, there has been no technique to target test generation for an undetected fault. This paper presents a novel technique to map pre-computed test sequences at the module level of a processor, to sequences of instructions. The module level...
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