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Due to the great generalization and the support of statistics, support vector machines (SVMs) has been widely applied to resolving multi-class classification problem. Numbers of multi-class SVM have been proposed. Compared with other multi-class SVM, binary tree of SVM (BTS) takes a good advantage of lower time consuming. However, there is some unnecessary data reassignment during constructing a binary...
Considering the problem that image defect's fineness, complex shape, difficultly to extract feature, and easily effected by noise on PCB products machine vision inspection system, the paper presented defect identification classification algorithm based on Naive Bayes and MetaClass , which resolved the problem that fine and complex defect is difficult to classify. Regard Naive Bayes algorithm to construct...
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