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Cubic type room‐temperature (RT) epitaxial Li0.5Ni0.5O and NiO thin films with [111] orientation grown on ultra‐smooth sapphire (0001) substrates were examined using synchrotron‐based thin‐film X‐ray diffraction. The 11 and 22 rocking curves including six respective equivalent reflections of the Li0.5Ni0.5O and NiO thin films were recorded. The RT B1 factor, which appears in the Debye–Waller factor,...
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