Search results for: Yu-Sheng Chen
2011 International Reliability Physics Symposium > MY.8.1 - MY.8.5
IEEE Electron Device Letters > 2011 > 32 > 3 > 390 - 392
IEEE Electron Device Letters > 2010 > 31 > 12 > 1473 - 1475
IEEE Electron Device Letters > 2009 > 30 > 7 > 703 - 705