Search results for: Yu-Sheng Chen
IEEE Electron Device Letters > 2014 > 35 > 2 > 202 - 204
IEEE Electron Device Letters > 2014 > 35 > 2 > 223 - 225
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.1.1 - 5E.1.7
IEEE Journal of Solid-State Circuits > 2012 > 47 > 6 > 1483 - 1496
2011 International Reliability Physics Symposium > MY.8.1 - MY.8.5
IEEE Electron Device Letters > 2011 > 32 > 11 > 1585 - 1587
IEEE Design & Test of Computers > 2011 > 28 > 1 > 64 - 71
IEEE Electron Device Letters > 2011 > 32 > 3 > 390 - 392