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The lifetime and reliability of photovoltaic modules (PV modules) is influenced by defects which have their origin either in manufacturing processes or in operation exposure. Characterization of PV modules is necessary for manufacturers to assure their warranty and to observe process difficulties during production process and for improving their modules during development processes. For customers...
In the paper a new nondestructive quality testing methods for MEMS were presented that can be applied on wafer level in early stage of the manufacturing process. The approach was applied to determine the thickness of KOH etched membranes from measured eigenfrequencies. The dynamic measurements of test specimen were performed by laser Doppler vibrometry. A finite element (FE) model was created to identify...
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