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The La0.65Sr0.35MnO3 (LSM)/SrTi0.2Fe0.8O3 (STF) multilayer is observed using scanning probe microscopy following a focused‐ion beam milling process with shallow incidence angle. Although the nominal thickness of each layer is about 5 nm, the exposed layers are magnified by several orders of magnitude on the surface after FIB cutting. This procedure enables high spatial resolution and coordinated property...
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