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At a constant modulation period (λ), nanostructured Cu/Cr multilayer films exhibit ductility scaling linearly with yield strength that varies with modulation ratio. The films with different λ have their own scaling relationship. The scaling slope for λ=25nm is much sharper than that for λ=50nm, indicating that a stronger interface constraint causes a larger reduction in ductility. These scaling relationships...
In Cu/Cr multilayers with modulation period (λ) ranging from 10 to 250nm, maxima are observed for both tensile ductility and fracture at a critical λ∼50nm, different from the monotonic λ dependence known for monolithic films. This unusual behavior is explained, via quantitative assessments based on a micromechanical model, by considering the competing thickness effects on the size of the microcracks...
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