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A multipurpose pattern-fitting program, RIETAN-2000, and a software package, VENUS, for three-dimensional (3D) visualization were substantially combined to grow into an integrated system for whole-pattern fitting (w.p.f.) based on the maximum entropy method (MEM). In MEM-based pattern fitting (MPF), 'observed' structure factors resulting from Rietveld analysis are analyzed by MEM to yield improved...
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