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The oxide film of TiH2 and HDH-Ti powder are investigated using X-ray photoelectron spectroscopy (XPS). The XPS depth profiles indicate that there exists mainly Ti2+, Ti3+, Ti4+ and Ti0 on TiH2 and HDH-Ti surface. The intensities of Ti 2p decrease for Ti4+, first increase and then decrease for Ti3+ and Ti2+, and increase all the time for Ti0 in the surface layer of TiH2 and HDH-Ti with the sputtering...
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