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A method is established to reliably determine surface conductance of single-layer or multi-layer atomically thin nano-carbon graphene structures. The measurements are made in an air filled standard R100 rectangular waveguide configuration at one of the resonant frequency modes, typically at TE103 mode of 7.4543GHz. Surface conductance measurement involves monitoring a change in the quality factor...
A general solution of the linear passive microwave network is presented for the characterization of thin film materials at high microwave frequencies. The mathematical formulas that correlate scattering parameters S 11 and S 21 with the distributed circuit parameters of the Z 0 ;Z s ;Z 0 network are given in closed form. The applicability of the general network...
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