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Reliability of a 2T-2C, 448kbit FRAM embedded within 180nm CMOS is presented. The results indicate a 10-year, 125°C data retention capability for this technology. Further, sufficient signal margin remains for sensing following 260°C Pb-free solder reflow step demonstrating that code data can be stored through the board-attach process. A new margin test approach, which enables depolarization effects...
We present the design concept of a bimetallic thermocouple array-based temperature sensor to monitor thermal behavior of integrated circuits. Our proposed design is able to provide fine-grain thermal characterization. Such a sensor array that is capable of monitoring a large area accurately at a fine granularity is essential to perform reliable and effective dynamic thermal management for high performance...
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