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This paper focused on the delamination study of low profile leadframe package with exposed pad (eLQFP). In this type of package, a specification of silver plating area is required for bond pad. With the shrinkage of the non-plating pad area, and because of low adhesion strength between silver and mold compound, the interface of mold compound and die-pad in the silver plating area may potentially delaminate...
Flip chip packaging of ultra fine pitch integrated circuits (ICs) on organic substrates aggravates the stress-strain concerns, requiring a fundamentally different system approach to interconnections, underfill, interfaces, and the substrate. This work demonstrates a novel interconnection solution with excellent reliability for ultra-fine pitch (~30 mum) silicon (Si) on organic first level interconnections...
This paper addresses the state of art nano science and technology regarding next generation high density microelectronics and photonics packaging applications, including carbon nanotubes (CNTs) for electrical/thermal devices, nano lead-free alloy, molecular wires for electrical interconnects, etc.
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