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Comparing the clinical performance of digital mammography technologies is challenging. The aim of this work is to develop and test a methodology for adjusting mammographic images taken on a given imaging system to simulate their appearance as if taken on a different system. Such methodology would be very useful for a wide range of system performance and design studies using both phantom and clinical...
We construct a model for baryon diffusion which has the desired properties of analyticity and causality. The model also has the desired property that the noise correlation function is not a Dirac delta function in space and time. The model depends on three time constants in addition to the diffusion constant. This description can be incorporated into 2nd order viscous hydrodynamical models of heavy...
This paper presents the analysis and design of a wire-grid polarizer comprising laminated parallel plates with a high extinction ratio less than 10−6 over the range 0.1 to 1.91 THz. One waveguide is extracted with the periodicity of the wire-grid and is analyzed using the mode matching method. Cyclo olefin polymer film which has low loss in the terahertz frequency band is used for a supporting substrate...
The presented theoretical analysis of random telegraph signal (RTS) and 1/f noise data provides consistent interpretation of the measurement results allowing trap characteristics to be extracted and the atomic structure of oxide traps to be identified. We emphasize the critical role of the lattice structural relaxation associated with charge trapping/detrapping, which represents one of the major factors...
Tunnel oxide degradation in TANOS devices and its origins were investigated in terms of program, erase, and endurance device operation modes. It was found that the erase operation may cause significant tunnel oxide degradation, while the degradation due to program operation is negligible. In the erase and endurance modes, tunnel oxide degradation is primarily controlled by the process of electron...
We present a comprehensive description of the processes contributing to the electron capture/emission by bulk oxide traps, which allows for interpretation of RTS and 1/f noise data and extraction of the trap characteristics. It is shown that the electron capture/emission times could be controlled by the trap structural relaxation (caused by the trapped electrons) rather than by the electron tunneling...
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