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For sub-nanometer designs, testing for small-delay defects (SDDs) is essential to achieve low defect escapes for the manufactured silicon. Existing solutions for testing SDDs are not practical for high-volume production environments due to large pattern count or long compute time, or both. In this paper, we present a production-friendly method that takes the circuit topology into account while generating...
There is an ever-increasing demand for higher performance microprocessors within a given power budget. This demand forces design choices - that were once seen only in high-speed custom blocks - to spread throughout the microprocessor core. These unique design structures, combined with the nanometer technology test challenges such as crosstalk, process variations, power-supply noise, and resistive...
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