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The problem that is addressed here is the measurement of the mechanical properties of very thin, transparent films using bulge tests. All existing techniques make use of reflection from the film surface, but they can be difficult or impossible to apply to very thin, transparent films. Consequently, a novel approach based on the formation of a lens structure and using transmitted light is developed...
MEMS and NEMS devices typically have a large surface area to volume ratio. As a result, a major concern in the development of such devices is friction. Contact radii in MEMS and NEMS devices are expected to range from 10−8<a<10−5 m. This regime, which generally lies between the limits of single asperity and macroscopic contact, has yet to be explored because the apparati used to characterize...
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