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Timing-related defects are a major cause of test escapes and field returns for very deep-submicron (VDSM) integrated circuits. Small-delay variations induced by crosstalk, process variations, power supply noise, and resistive opens and shorts can cause timing failures in a design, leading to quality and reliability concerns. This article describes the authors' work with a previously proposed test-grading...
Test data volume and test application time are major concerns for large industrial circuits. In recent years, many compression techniques have been proposed and evaluated using industrial designs. However, these methods do not target sequence- or timing-dependent failures while compressing the test patterns. Timing-related failures in high-performance integrated circuits are now increasingly dominated...
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