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We have studied the growth of thin Cu films grown on Ru(0001) and oxygen-precovered Ru(0001), using X-ray photoelectron diffraction and measuring experimental Cu 2p 3/2 (E kin = 556 eV) and Ru 3d (E kin = 1206 eV) intensities in the full 2π solid angle above the surface for Cu coverages from submonolayer up to several monolayers (ML). Our data...
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