Search results for: M. Vos
Surface and Interface Analysis > 48 > 7 > 415 - 421
IEEE Transactions on Medical Imaging > 2010 > 29 > 8 > 1504 - 1515
Journal of Electron Spectroscopy and Related Phenomena > 2009 > 169 > 1 > 35-40
Surface and Interface Analysis > 48 > 7 > 415 - 421
IEEE Transactions on Medical Imaging > 2010 > 29 > 8 > 1504 - 1515
Journal of Electron Spectroscopy and Related Phenomena > 2009 > 169 > 1 > 35-40