Search results for: T. Takeshita
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 142 - 148
IEEE Photonics Technology Letters > 2009 > 21 > 13 > 896 - 898
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 142 - 148
IEEE Photonics Technology Letters > 2009 > 21 > 13 > 896 - 898