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Built-in self test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive external test equipment. The presented test strategies can also be used at wafer-level...
This paper addresses key technical and economic issues in the design of on-chip measurement circuitry that can be utilized to reduce the cost of testing. A brief outline is provided for research work related to analog/RF built-in self- test (BIST), on-chip instrumentation, and testing requirements of RF front-end blocks. The overview is intended to present test cost reduction requirements and techniques...
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