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This paper presents a simple built-in current sensor (BICS) design for quiescent current (I DDQ ) testing of CMOS data converter circuits. The proposed BICS works in two modes: the normal mode and the test mode. In the normal mode, the BICS is isolated from the circuit under test (CUT) due to which there is no performance degradation of the circuit. In the testing mode, the BICS detects the...
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