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This paper examines the impact of technology scaling to 22 nm on sub-threshold circuit design and proposes several solutions for sub-threshold circuits in new processes. To maintain energy-efficient sub-threshold operation, we must reduce variation and suppress leakage current. To combat random variation and minimize energy for nodes below 45 nm, we show that special strategies are needed for different...
Circuit reliability under statistical process variation is an area of growing concern. For highly replicated circuits such as SRAMs and flip flops, a rare statistical event for one circuit may induce a not-so-rare system failure. The Statistical Blockade was proposed as a Monte Carlo technique that allows us to efficiently filter-to block-unwanted samples insufficiently rare in the tail distributions...
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