Search results for: Jong‐Min Kim
Microelectronics Reliability > 2016 > 57 > C > 93-100
Microelectronics Reliability > 2012 > 52 > 6 > 1165-1173
Microelectronics Reliability > 2012 > 52 > 3 > 595-602
Microelectronics Reliability > 2011 > 51 > 4 > 812-818
Microelectronics Reliability > 2011 > 51 > 4 > 819-825