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An on-chip measurement circuit is proposed as a monitor to detect on-line HCD (hot-carrier induced degradation) here, which can be integrated and degraded with the host device, and give an alarm when the device need replacing. This is done prior to actual device failure and able to estimate down time of the system where this device is used, and it only needs a very small area.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.