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In this work, we discuss a methodology for rapid statistical analysis of antenna structures. The approach exploits response features, which are appropriately selected characteristic points of the antenna response that are important to determine satisfaction/violation of given performance requirements. As the dependence of the feature point coordinates on antenna geometry parameters is much less nonlinear...
Fast statistical analysis of antenna structures using response features is addressed. Our approach exploits response surface approximations of suitably selected characteristic points of the antenna response. Taking advantage of close-to-linear dependence of the feature point coordinates on antenna geometry parameters allows for accurate yet cheap yield estimation. Extension of the technique for tolerance-aware...
A rapid statistical analysis and yield estimation of compact microwave couplers involving multiple performance parameters has been presented. The analysis is realized using a fast surrogate model representing appropriate characteristic points of the coupler response. Because of less nonlinear dependence of the characteristic points on the structure geometry (compared to the original response, i.e...
In this paper, a technique for low-cost statistical analysis and yield estimation of compact microwave couplers has been presented. The analysis is executed at the level of a fast surrogate model representing selected characteristic points of the coupler response that are critical to determine satisfaction/violation of the prescribed design specifications. Because of less nonlinear dependence of the...
In this paper, we propose a simple, yet reliable methodology to expedite yield estimation and optimization of microwave structures. In our approach, the analysis of the entire response of the structure at hand (e.g., -parameters as a function of frequency) is replaced by response surface modeling of suitably selected feature points. On the one hand, this is sufficient to determine whether a design...
A technique for rapid yield estimation of microwave structures is proposed. Instead of analyzing the entire response of the structure of interest, only the set of suitably selected feature points is being modeled and utilized to determine whether the response satisfies or violates given performance specifications. By exploiting the almost linear dependence of the feature points on the designable parameters,...
We enhance a tuning space mapping algorithm through a response correction. We demonstrate that the response corrected tuning model can serve as a high-performance surrogate for fast yield estimation and design centering. We illustrate yield analysis of a second-order tapped-line microstrip filter using our model. We perform yield-driven design on a double-ring filter example and verify the design...
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