Search results for: T. Dai
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-1.1 - EL-1.3
IEEE Electron Device Letters > 2012 > 33 > 6 > 905 - 907
IEEE Transactions on Nanotechnology > 2011 > 10 > 5 > 1161 - 1165
IEEE Sensors Journal > 2011 > 11 > 11 > 3036 - 3041