Search results for: Ying Chen
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
IEEE Electron Device Letters > 2012 > 33 > 3 > 411 - 413
Biosensors and Bioelectronics > 2011 > 26 > 6 > 3077-3080
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
IEEE Electron Device Letters > 2012 > 33 > 3 > 411 - 413
Biosensors and Bioelectronics > 2011 > 26 > 6 > 3077-3080