Search results for: J. Kim
2016 IEEE International Electron Devices Meeting (IEDM) > 6.7.1 - 6.7.3
IEEE Electron Device Letters > 2016 > 37 > 2 > 220 - 223
2016 IEEE International Electron Devices Meeting (IEDM) > 6.7.1 - 6.7.3
IEEE Electron Device Letters > 2016 > 37 > 2 > 220 - 223