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Since scan testing is not based on the function of the circuit, but rather its structure, scan testing is considered to be a form of over testing or under testing. It is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical fault testing and timing fault testing. This paper proposes...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.