Search results for: F. Zhang
2015 IEEE International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
IEEE Electron Device Letters > 2014 > 35 > 2 > 160 - 162
2013 IEEE International Electron Devices Meeting > 15.6.1 - 15.6.4
IEEE Transactions on Applied Superconductivity > 2013 > 23 > 3-2 > 5600704
IEEE Electron Device Letters > 2012 > 33 > 4 > 480 - 482
IEEE Electron Device Letters > 2012 > 33 > 12 > 1681 - 1683
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341