Search results for: Yi Peng
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 121 - 126
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 236 - 244
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 121 - 126
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 236 - 244