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A Built-In Self-Test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the test time required by the ORA for analog measurements...
A built-in self-test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the effects of phase delay on analog functionality measurements...
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