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Silica antireflective films modified by polyvinyl butyral (PVB) were deposited on fused silica substrates by sol–gel process. The effects of PVB on the microstructure and laser damage threshold (LIDT) of films were investigated. The results of the nano particle analyzer and scanning probe microscope revealed that PVB molecules surrounded silica particles and controlled the particle growth, which resulted...
Atom force microscopy (AFM) is used to investigate micro-morphology of various types of scratches in the fused silica surface and sub-surface. Based on the shape, scratches can be classified as lateral scratch, radial scratch, Hertizan cone scratch, and trailing indent scratch. From forming mechanism, scratches can be classified as plastic scratch, brittle scratch and mixed scratch. The statistical...
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