Search results for: L. Chen
Microelectronics Reliability > 2013 > 53 > 3 > 356-362
Microelectronics Reliability > 2006 > 46 > 7 > 1209-1213
Microelectronics Reliability > 2006 > 46 > 2-4 > 637-640
Microelectronics Reliability > 1997 > 37 > 3 > 531