Search results for: Wei‐Cheng Lin
Microelectronics Reliability > 2016 > 60 > C > 20-24
Microelectronics Reliability > 2015 > 55 > 8 > 1163-1168
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 2-1 > 367 - 373
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1049 - 1055