Search results for: Rui Guo
Materials Characterization > 2015 > 110 > C > 44-51
Microelectronics Reliability > 2014 > 54 > 11 > 2550-2554
Journal of Alloys and Compounds > 2014 > 588 > Complete > 622-627
Materials Characterization > 2015 > 110 > C > 44-51
Microelectronics Reliability > 2014 > 54 > 11 > 2550-2554
Journal of Alloys and Compounds > 2014 > 588 > Complete > 622-627