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The practical approach to implement a 1 Ω current probe with verification for measuring the IC conducted emission is proposed. The 1 Ω/150 Ω direct coupling method is reviewed and the considerations on improving the applicable bandwidth of 1 Ω method are discussed. The critical component, 1 Ω resistor which dominates the frequency response, is designed. The realized 1 Ω probe was fully certified with...
The direct RF power injection (DPI) measurement up to 18 GHz is proposed to investigate the IC immunity. The DPI method is reviewed and the consideration of extending frequency range is discussed. Furthermore, the details of the measurement setup are depicted in this work. The critical part, on-board injection network in the power injection path with a 3 dB bandwidth of 18.7 GHz is realized. A low...
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