Search results for: Yu Chen
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 7 - 12
IEEE Electron Device Letters > 2010 > 31 > 11 > 1178 - 1180
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 7 - 12
IEEE Electron Device Letters > 2010 > 31 > 11 > 1178 - 1180