Search results for: Michel Bosman
Advanced Materials > 34 > 25 > n/a - n/a
Advanced Materials > 34 > 25 > n/a - n/a
Advanced Functional Materials > 32 > 15 > n/a - n/a
Advanced Materials > 33 > 32 > n/a - n/a
Advanced Functional Materials > 31 > 5 > n/a - n/a
Advanced Materials > 32 > 25 > n/a - n/a
Advanced Materials > 32 > 25 > n/a - n/a
physica status solidi (RRL) – Rapid Research Letters > 13 > 12 > n/a - n/a
Advanced Materials > 28 > 34 > 7486 - 7493
Advanced Materials > 28 > 34 > 7549 - 7549
Microelectronics Reliability > 2016 > 61 > C > 71-77
Advanced Materials > 28 > 16 > 3138 - 3144
Microelectronics Reliability > 2015 > 55 > 9-10 > 1412-1416
Microelectronics Reliability > 2015 > 55 > 9-10 > 1422-1426
Advanced Materials > 26 > 42 > 7185 - 7189
Microelectronics Reliability > 2014 > 54 > 9-10 > 2295-2299
Microelectronics Reliability > 2014 > 54 > 9-10 > 2266-2271
2014 IEEE International Reliability Physics Symposium > 5B.4.1 - 5B.4.7