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Based on the model of memeristor fabricated at HP laboratory, a new multiplexed flip-flop is proposed which can support power-off mode for scan testing. Testing data can be stored in memristor during the power-off time. The analyzes are verified with SPICE simulation, signal waveforms show that the presented memristive multiplexed flip-flop meet the requirements for low-power scan testing.
To simulate the special state of ice-covered insulators, the traditional circuit model for insulators flashover was improved by considering the influence of air gaps. Take the energy varying accompany the ice-melting and water vapor into account, Cassie and Mayr differential equations were combined to describe the arc resistance. Based on the dynamic equations of arc resistance and residual ice-layer...
IGBT is one of the key components of motor driving system for electric vehicles, and its reliability directly affects the reliability of the electric vehicles. The reliability of the IGBT is affected by the loss and the junction temperature in working condition. To predict the IGBTpsilas loss and thermal response, especially in the case of adverse dynamic conditions, the dynamic loss model and the...
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