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This paper presents a scheme of 14-bit 100MS/s pipelined analog-to-digital converters (ADCs) with digital calibration. Signal-dependent pseudo-random dithering has been used in the proposed model to measure the errors caused by finite gain and capacitors mismatch in multiplying digital-to-analog converters and correct them in the digital domain. Comparing with fixed-magnitude PN dithering, a signal-dependent...
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